平麵度測量  製造商、經銷商、供應商

Interferometric measuring systems for non-contact flatness measurement of finish-machined parts.
TOPOS interferometers operate according to the principle of grazing incidence of light. The flatness of also rougher parts can be measured, which show no more fringe pattern with optical flats or Fizeau-interferometers. Next to lapped or ground parts also polished parts can be measured.

By default, TOPOS flatness measuring instruments are available with two different sizes of measuring field: with a diameter of 100mm or 50m. An adaptation towards special sizes is possible according to request.

The parts may consist of diverse materials:

Examples of application areas:

在測量表麵平整度和評估形狀參數時，可使用非接觸式測量技術，如使用白光幹涉測量法的相幹掃描幹涉儀，在大視野範圍內進行測量，避免忽略缺陷的風險。通過在幾分之一秒內捕捉數百萬個測量點，光學平麵度測量可確保對整個表麵進行可靠的檢測，從而在生產的早期階段就能發現並找出有缺陷的部件。由於要檢測的表麵不會變形，因此即使是在柔軟或非常脆弱的試樣上也能進行可靠的平麵度評估。光學表麵平麵度測量是質量控製或生產中 100% 檢測的理想選擇。